14th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS-2016)
Yerevan, Armenia, October 14 - 17, 2016
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Call For Papers

The main target of the East-West Design & Test Symposium (EWDTS) is to exchange experiences between the scientists and technologies of the Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic systems. The symposium aims at attracting scientists especially from countries around the Black Sea, the Baltic states and Central Asia. We cordially invite you to participate and submit your contribution(s) to EWDTS’16 which covers (but is not limited to) the following topics:

  • Analog, Mixed-Signal and RF Test
  • Analysis and Optimization
  • ATPG and High-Level TPG
  • Automotive Reliability & Test
  • Built-In Self Test
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design Verification and Validation
  • EDA Tools for Design and Test
  • Embedded Software Performance
  • Failure Analysis, Defect and Fault
  • Functional Safely
  • High-level Synthesis
  • High-Performance Networks and Systems on a Chip
  • Internet of Things Design & Test
  • Low-power Design
  • Memory and Processor Test
  • Modeling & Fault Simulation
  • Network-on-Chip Design & Test
  • Modeling and Synthesis of Embedded Systems
  • Object-Oriented System Specification and Design
  • On-Line Testing
  • Power Issues in Design & Test
  • Real Time Embedded Systems
  • Reliability of Digital Systems
  • Scan-Based Techniques
  • Self-Repair and Reconfigurable Architectures
  • Signal and Information Processing in Radio and Communication Engineering
  • System Level Modeling, Simulation & Test Generation
  • System-in-Package and 3D Design & Test
  • Using UML for Embedded System Specification
  • Optical signals in communication and Information Processing
  • CAD and EDA Tools, Methods and Algorithms
  • Hardware Security and Design for Security
  • Logic, Schematic and System Synthesis
  • Place and Route
  • Thermal and Electrostatic Analysis of SoCs
  • Wireless and RFID Systems Synthesis

 

Symposium Deadlines:

Submission deadline:            September 3, 2016

Notification of acceptance:   September 15, 2016

Papers submission info: http://www.ewdtest.com/conf

Please go to https://easychair.org/conferences/?conf=ewdts2016  to submit your paper.

Organizing committee address: Prof. Vladimir Hahanov, Design Automation Department, Kharkov National University of Radio Electronics, Lenin ave. 14, Kharkov, 61166, Ukraine.

Tel.: +380-57-702-13-26, E-mail: hahanov@icloud.com

 

The Symposium is organised by volunteers under Local Arrangements team in Armenia jointly with Kharkov National University of Radio Electronics under the support of Test Technology Technical Council (TTTC) of the IEEE Computer Society.

 

The IEEE promotes the engineering process of creating, developing, integrating, sharing, and applying knowledge about electronic and information technologies and sciences for the benefit of humanity and the profession
The purposes of this IEEE Society shall be scientific, literary, and educational in character. The Society shall strive to advance the theory, practice, and application of computer and information processing science and technology and shall maintain a high professional standing among its members. The scope of the Society shall encompass all aspects of theory, design, practice, and application relating to computer and information processing science and technology
TTTC’s goals are to contribute to our members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art. In particular, TTTC aims at facilitating the knowledge flow in an integrated manner, to ensure overall quality in terms of technical excellence, fairness, openness, and equal opportunities

East-West Design & Test 2017 Design Automation Department 2017