15th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS-2017)
Novi Sad, Serbia, Sept 29 - Oct 2, 2017
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Welcome to IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS) 2017 Website

EWDTS-2017 explores the novel trends in testing, debug, diagnostics and repair of microelectronic circuits and systems.

EWDTS-2017 topics:

  • Analog, Mixed-Signal and RF Test
  • ATPG and High-Level TPG
  • Automotive Reliability & Test
  • Built-In Self Test
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design Verification and Validation
  • EDA Tools for Design and Test
  • Embedded Software
  • Failure Analysis & Fault Modeling
  • Functional Safely
  • High-level Synthesis
  • High-Performance Networks and Systems on a Chip
  • Internet of Things Design & Test
  • Low-power Design
  • Memory and Processor Test
  • Modeling & Fault Simulation
  • Network-on-Chip Design & Test
  • Flexible and Printed Electronics
  • Applied Electronics – Automotive/Mechatronics
  • Algorithms
  • Object-Oriented System Specification and Design
  • On-Line Testing
  • Power Issues in Design & Test
  • Real Time Embedded Systems
  • Reliability of Digital Systems
  • Scan-Based Techniques
  • Self-Repair and Reconfigurable Architectures
  • Signal and Information Processing in Radio and Communication Engineering
  • System Level Modeling, Simulation & Test Generation
  • System-in-Package and 3D Design & Test
  • Using UML for Embedded System Specification
  • Optical signals in communication and Information Processing
  • CAD and EDA Tools, Methods and Algorithms
  • Hardware Security and Design for Security
  • Logic, Schematic and System Synthesis
  • Place and Route
  • Thermal and Electrostatic Analysis of SoCs
  • Wireless and RFID Systems Synthesis
  • Sensors and Transducers
  • Medical Electronics
  • Design of Integrated Passive Components

 

East-West Design & Test 2017 Design Automation Department 2017