IEEE East - West Design & Test International Workshop 2006, September 15-19, Sochi, RussiaGENERAL INFORMATION
Total number of authors: 246.
Number of papers: 103.
Preliminary number of participants: 103.
Number of countries: 27 (Armenia, Austria, Belarus, Brazil, Bulgaria, Canada, China, Korea, Czech Republic, Denmark, Estonia, Finland, France, Georgia, Germany, India, Iran, Ireland, Italy, Jordan, Latvia, Pakistan, Poland, Russia, Sweden, Ukraine, USA).
SPONSORED BY
IEEE Computer Society Test Technology Technical Council
FINANCIALLY SUPPORTED BY
Intel, Russia
Microsoft, Ukraine
Cadence, Russia IN COOPERATION WITH
Tallinn University of Technology, Estonia
Moscow Institute of Control Sciences, Russia
Kiev Institute of Modeling Problems in Power Engineering, Ukraine
RAS Institute of Design Problems in Microelectronics, Russia
Aldec Inc., USA IEEE East - West Design & Test International Symposium 2007, September 7-10, Yerevan, Armenia GENERAL INFORMATION
Total number of authors: 353. Number of papers: 152. Preliminary number of participants: 150. Number of countries: 32 (Algeria, Armenia, Australia, Bangladesh, Brazil, Canada, Egypt, Estonia, France, Germany, Hong-Kong, India, Iran, Ireland, Italy, Jordan, Moldova, Nigeria, Norway, Pakistan, Poland, Romania, Russia, Saudi Arabia, Spain, Syria, Sweden, Taiwan, UK, Ukraine, USA). SPONSORED BY
IEEE Computer Society Test Technology Technical Council FINANCIALLY SUPPORTED BY
Cadence, Europe Echostar, USA Intel, Russia INTSPEI, Ukraine-USA Mentor Graphics, Egypt National Instruments, Asia Synopsys, USA Virage Logic, Armenia Tallinn University of Technology, Estonia IN COOPERATION WITH
Tallinn University of Technology, Estonia
Moscow Institute of Control Sciences, Russia
Kiev Institute of Modeling Problems in Power Engineering, Ukraine
RAS Institute of Design Problems in Microelectronics, Russia EWDTS’07 Plenary and Invited Speakers | Magdy Abadir
Freescale, USA Jacob Abraham
Univ of Texas at Austin, USA Vinod Agarwal
SemIndia, USA Jack Arabian
Comparative Management Associates, USA Ron Collett
Numetrics, USA Serge Demidenko
Massey University, New Zealand Bashir El-Hashimi
Univ of Southampton, UK Hazem El-Tahawy
Mentor Graphics, Egypt Patrick R. Haspel
Cadence, Europe Sybille Hellebrand
Univ of Paderborn, Germany Jose Luis Huertas Diaz
CNM, Spain Andre Ivanov
Univ of British Columbia, Canada | Ravi Lyer
Univ of Illinois, USA Rohit Kapur
Synopsys, USA Liviu Miclea
Univ of Tech. Cluj, Romania Zain Navabi
North Eastern Univ, USA Vladimir L Pavlov
INTSPEI, Ukraine – USA Paolo Prinetto
Politechnico di Torino, Italy CP Ravikumar
Texas Instruments, India Ricardo Reis
UFRGS, Brazil Fred Sendig
Synopsys, USA Fabian Vargas
PUCRS, Brazil Hans-Joachim Wunderlich
Univ of Stuttgart, Germany Yervant Zorian
Virage Logic, USA |
IEEE East - West Design & Test International Symposium 2008, October 9-12, Lviv, Ukraine
GENERAL INFORMATION
Total number of authors: 227.
Number of papers: 93.
Preliminary number of participants: 80.
Number of countries: 24 (Armenia, Belarus, Brazil, Canada, Czech Republic, England, France, Germany, Greece, India, Iran, Ireland, Italy, Japan,Latvia, Moldova, Pakistan, Poland, Rumania, Russia, saudi Arabia, Sweden, Ukraine, USA).
SPONSORED BY
IEEE Computer Society Test Technology Technical Council
FINANCIALLY SUPPORTED BY
Intel, Russia
Microsoft, Ukraine
Cadence, Russia
IN COOPERATION WITH
Tallinn University of Technology, Estonia
Moscow Institute of Control Sciences, Russia
Kiev Institute of Modeling Problems in Power Engineering, Ukraine
RAS Institute of Design Problems in Microelectronics, Russia
Aldec Inc., USA
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