8th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS 2010) St. Petersburg, Russia, September 17-20, 2010Call for ParticipationThe main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences in the field of design, design automation and test of electronic circuits and systems, between the technologists and scientists from Eastern and Western Europe, as well as North America and other parts of the world, The symposium aims at attracting attendees especially from the Newly Independent States (NIS) and countries around the Black Sea and Central Asia. Place The Symposium will take place in St. Petersburg, Russia, one of the world's most beautiful cities, that has all the ingredients for an unforgettable experience: high art, lavish architecture, an extraordinary history and rich cultural. From the mysterious twilight of the White Nights to world-beating opera and ballet productions on magical winter evenings, St. Petersburg charms and entices in every season. Also St. Petersburg is the city of science and high tech R&D. We cordially invite you to attend and actively participate in this unique EWDTS’10. Deadlines| Submission deadline | July, 10, 2010 | | Notification of acceptance | August 1st, 2010 |
Submit paper Please go to http://www.easychair.org/conferences/?conf=ewdts10 to submit your paper. InformationFor more information please visit: http://www.ewdtest.com/conf/ and/or contact: Prof. Vladimir Hahanov Design Automation Department Kharkov National University of Radio Electronics Lenin ave, 14 Kharkov, 61166 Ukraine Tel.: +380 (57) 702-13-26, E-mail:
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The symposium is organized by Kharkov National University of Radio Electronics, in cooperation with Tallinn University of Technology, St. Petersburg State Electro technical University “LETI” and Institute for System Programming of RAS. It is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) and financially supported by Virage Logic, Aldec, Synopsys, Kaspersky Lab, Teprocomp, DataArt Lab, Тallinn Technical University, JTAG Technologies, Donetsk Institute of Road Transport. All the reports, made in the Symposium will be published in Science Journal “Radioelectronics and Informatics” (ISSN 1563-0064) which is serving electronic test professionals in concurrence with the Test Technology Technical Council (TTTC) of the IEEE Computer Society.
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