8th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS 2010)
St. Petersburg, Russia, September 17 -20, 2010
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The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between the scientists and technologies of the Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic systems. The symposium aims at attracting scientists especially from countries around the Black Sea, the Baltic states and Central Asia. We cordially invite you to participate and submit your contribution(s) to EWDTS’09 which covers (but is not limited to) the following topics:

  • Analog, Mixed-Signal and RF Test
  • Analysis and Optimization
  • ATPG and High-Level TPG
  • Built-In Self Test 
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design for Testability
  • Design Verification and Validation
  • EDA Tools for Design and Test
  • Embedded Software Performance
  • Failure Analysis, Defect and Fault
  • FPGA Test
  • HDL in test and test languages
  • High-level Synthesis
  • High-Performance Networks and Systems on a Chip
  • Low-power Design
  • Memory and Processor Test
  • Modeling & Fault Simulation
  • Network-on-Chip Design & Test
  • Modeling and Synthesis of Embedded Systems
  • Object-Oriented System Specification and Design
  • On-Line Test
  • Power Issues in Testing
  • Real Time Embedded Systems
  • Reliability of Digital Systems
  • Scan-Based Techniques
  • Self-Repair and Reconfigurable Architectures
  • Signal and Information Processing in Radio and Communication Engineering
  • System Level Modeling, Simulation & Test Generation
  • Using UML for Embedded System Specification 


    CAD Session:

    • CAD and EDA Tools, Methods and Algorithms
    • Design and Process Engineering
    • Logic, Schematic and System Synthesis
    • Place and Route
    • Thermal, Timing and Electrostatic Analysis of SoCs and Systems on Board
    • Wireless Systems Synthesis
    • Digital Satellite Television

The Symposium will take place in St. Petersburg, Russia, one of the world's most beautiful cities, that has all the ingredients for an unforgettable experience: high art, lavish architecture, an extraordinary history and rich cultural. From the mysterious twilight of the White Nights to world-beating opera and ballet productions on magical winter evenings, St. Petersburg charms and entices in every season. Also St. Petersburg is the city of science and high tech R&D.

Symposium Deadlines:

Submission deadline: July 15, 2010

Notification of acceptance: August 1st, 2010

Papers submission info: http://www.ewdtest.com/conf

Please go to http://www.easychair.org/conferences/?conf=ewdts10 to submit your paper.

Organizing committee address: Prof. Vladimir Hahanov, Design Automation Department, Kharkov National University of Radio Electronics, Lenin ave, 14, Kharkov, 61166, Ukraine.

Tel.: +380-57-702-13-26, E-mail: This e-mail address is being protected from spam bots, you need JavaScript enabled to view it , www.ewdtest.com/conf/

The symposium is organized by Kharkov National University of Radio Electronics, in cooperation with Tallinn University of Technology, St. Petersburg State Electro technical University “LETI” and Institute for System Programming of RAS. It is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) and financially supported by Virage Logic, Aldec, Synopsys, Kaspersky Lab, Teprocomp, DataArt Lab, Тallinn Technical University, JTAG Technologies, Donetsk Institute of Road Transport.

All the reports, made in the Symposium will be published in Science Journal “Radioelectronics and Informatics” (ISSN 1563-0064) which is serving electronic test professionals in concurrence with the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

 
IEEE Echostar Kaspersky DataArt Aldec IEEE Computer Society INTSPEI TEPRO ItStep Kharkiv National University of Radio Electronics Tallinn University of Technology Virage Logic
East-West Design & Test 2009 Design Automation Department 2009
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